XAPTEC - industrielle Bildverarbeitung


Classical measuring technology and the
advantages of the compound eye.

XAPTEC - industrielle BildverarbeitungXAPTEC - industrielle Bildverarbeitung

XC Serie IMS crp

The Xaptec XC sensor systems are specially adapted for detecting the surface contour of strip and foil-shaped materials. The classical distance measurement approach of laser triangulation is combined with an innovative architecture of optoelectronic image sensors, which results in a continuous and non-contact analysis of profiles - approximately regardless of the material characteristics. By doing so, the Xaptec XC series can realise a lower measurement uncertainty while achieving faster measuring rates and a significant reduced installation place for almost any bandwidth, in contrast to systems using conventional line scan or matrix cameras. The projected laser line is being reflected to up to 50 high-resolution image sensors per meter bandwidth. Using intelligent algorithms, the processing units in the system interpret the gathered information in real time and send the data to a PLC control, a production guidance system or a visualization unit. The whole measurement is performed contactless, so that there are no traces left behind at the material.


bmwi   Aia   Exist

Write us

Address Neidenburger Str. 10
  D - 45897 Gelsenkirchen
  +49 209 883070 0
Email info@xaptec.de

We use cookies on our website. Some of them are essential for the operation of the site, while others help us to improve this site and the user experience (tracking cookies). You can decide for yourself whether you want to allow cookies or not. Please note that if you reject them, you may not be able to use all the functionalities of the site.