The Xaptec XC sensor systems are specially adapted for detecting the surface contour of strip and foil-shaped materials. The classical distance measurement approach of laser triangulation is combined with an innovative architecture of optoelectronic image sensors, which results in a continuous and non-contact analysis of profiles - approximately regardless of the material characteristics. By doing so, the Xaptec XT-C series can realise a lower measurement uncertainty while achieving faster measuring rates and a significant reduced installation place for almost any bandwidth, in contrast to systems using conventional line scan or matrix cameras. The projected laser line is being reflected to up to 50 high-resolution image sensors per meter bandwidth. Using intelligent algorithms, the processing units in the system interpret the gathered information in real time and send the data to a PLC control, a production guidance system or a visualization unit. The whole measurement is performed contactless, so that there are no traces left behind at the material.