MULTI SENSOR TECHNOLOGY
Classical measuring technology and the
advantages of the compound eye.
XAPTEC XS Systeme
Xaptec XS Systems
The Xaptec XS-Series is specified on the registration of faults on surfaces of strip or sheet material. Therefore a sensor bar and one or two light bars are placed above the strip as one compact module. Optionally it is possible to check the other side of the strip with another identical build up.
XAPTEC XT Systems
Xaptec XT Systems
The strip sensor systems of the XT-series are specialized on the registration of strip characteristics such as width, cracks, holes or the strip center position. Following the function principle of a transmitted light process the Xaptec sensorbar is placed above and a lightsource underneath the strip. Nearly independent of the material it is possible to control any strip or sheet material opto-electronically and contactless.
XAPTEC XC Systems
XAPTEC XC SYSTEMS
The Xaptec XC sensor systems are specially adapted for detecting the surface contour of strip and foil-shaped materials. The classical distance measurement approach of laser triangulation is combined with an innovative architecture of optoelectronic image sensors, which results in a continuous and non-contact analysis of profiles - approximately regardless of the material characteristics.
Cooperations
